Wafer S Parameter Measurements

Farran offers a variety of solutions for on-wafer S-parameters measurements. CobaltFx systems are an excellent choice for a full millimeter wave vector network analyser solutions in 50 - 110 GHz range and FEV frequency extension systems for extending the range of your existing or new VNA to 40 - 500 GHz. Both of these systems can be easily integrated with the wafer probe system and be configured to perform automated measurements that allow to evaluate the true performance of your bare-die devices. Select from the equipment list below or contact us and we will hapily advise you which Farran product suits your needs best.

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